The most recent generation of the proprietary EIGER HPC detector offers a distinctive set of enhanced and new benefits for XRD: high frame rate enabling 2D data collection in continuous scanning mode, single photon counting without spatial distortion, highest count rates and dynamic range. In combination with the Bruker D8TM X-ray diffraction systems, switching between 0D, 1D, and 2D mode is possible.
These new features are fully integrated into the Bruker D8TM X-ray diffraction systems, and enable the EIGER2 R 500K detector to produce excellent diffraction data for applications from powder diffraction (XRPD), micro diffraction (µXRD), texture or residual stress analysis, crystallite size determination, thin film analysis by X-ray reflectometry (XRR), and high-resolution diffraction (HRXRD) to small angle X-ray scattering (SAXS and GISAXS). This powerful combination of the D8 ADVANCE or the D8 DISCOVER with the EIGER2 R 500K significantly extends and speeds up the analysis capabilities for XRD users.
“Collaborating from the early stage in the product development, we were able to provide our new EIGER2 R 500K detector with seamless integration into Bruker AXS D8 XRD systems. This is enabling customers to take advantage of cutting-edge detector technology for their laboratory right from the launch,” stated Christian Broennimann, the CEO of DECTRIS.
Dr. Lutz Bruegemann, the Bruker AXS Vice President and General Manager XRD , added, “The coordinated development teams at DECTRIS and Bruker have done a tremendous job. The result is outstanding synergy between the latest HPC detector technology and the most powerful and user-friendly XRD platform on the market, enabling customers to use the new EIGER 2R 500K seamlessly incorporated into our D8 diffraction solutions for many important applications.”
